Tape Probers
Diced Wafer Testing
Related Products
System Highlights:

    Fastest Chip Scanning System
    Smart Chip Aligning Algorithm
    Flexible Lighting Option for Various Chip Types
    Easy-to-Use Touch Panel Operating Interface
    Applicable for 4-6 Wafer after Expansion
    Different Inking Conditions
    Option for Bad-Cut Inspection
    1-4 Channels - Multi-Chip Probing Capability)
    Zoom-Lens Option for Wide Chip Size Application
    Double or Quad Cassettes for Continuous Mass-Production
Die Prober
Model DP76
Fully-Automatic Die Probing System
System Highlights:

    Dark Box Design
    Significant Throughput Improvement
    More Accurate Data Correlation to Package Level Test
    New Application Development
    Product File Management
    Accurate Probing Capability
    Programmable Pick & Place Force
    Advanced Chip Defect Detection
    Sort Page Post Confirmation
    Fully Remote Interface Provided (TTL, RS232C, GPIB, Address Lines)
System Highlights:

    Dark Box
    Fastest Chip Scanning System
    Flexible Alignment Methods
    Easy-to-Use Operation
    Full Message Control
    Precise Driving System for Probing
    Products with Filing Management
    Fully Remote Interface Provided (TTL, RS232C, GPIB, Address Lines)
Model P8000/P80C4
Fully-Automatic Tape Probing System
Model 3GP-VB
Semi-Automatic Tape Probing System
Zeta 380i - HBLED
Wafer Metrology
MPI - M7600
Map Sorting System
ESI - AccuScribe
LED Laser Scribing System
Tape Prober. Die Prober.
Semi-Automatic System Fully-Automatic System
MPI is the world leader in both semiconductor wafer-level probing technology and LED testing related equipment vendor. The company focuses in micro-probe technology for over a decade. MPI aims to develop reliable, state-of-art probing technology in order to enhance the competitiveness of his clients.
Camtek Condor 203
Defect Inspection
Front End Metrology/Inspection Back End Test & Measurement
CWI Technical Sales    Phone: 732-536-3964    Fax: 732-536-0495