Failure Analysis Solutions
CWI represents companies with leading failure analysis solutions for small to large companies.  Whether you are searching for a failure without
affecting the integrity, cut it up, test it both electrically and thermally, cleave it then prep down to SEM or TEM lamella, the leading companies we
represent have the solutions.
Test.
Acoustic.
Probe.
      Cut.
Cleave.
Prep.
Destructive
Nondestructive
MPI TS150:
Probe Station
Sonoscan - C-SAM®:
Acoustic Microscopy
Robson Technologies:
Test Fixtures
ESI:
Laser Cutting System
Camtek / Sela:
Microcleaving System
Camtek / SELA:
TEM/STEM & SEM Sample Preparation System
Microtronic:
Wafer Defect Review
Temptronic:
ThermoChuck® System
           
CWI Technical Sales  ·  Phone: 732-536-3964  ·  Fax: 732-536-0495  ·