High Power Device Test
CWI represents companies with leading High Power Device Testing solutions for small to large companies. Whether you are searching for a advanced
systems for Production, Measurement & Reliabilty, as well as, Probe Cards and Probe Systems. The leading companies we represent have the solutions.
Prober.
Probe Card.
Production.
Measure.
Reliability.
MPI - Probe Station
High Power Probe System

150mm & 200mm On-Wafer 
Rated for Up to 3kV (triax)
Rated for Up to 10kV (coax)
MPI HV Probe Card
High Power Semiconductor
Probe Card

Up to 10KV & 100 Amps
ipTest - Wafer Testing
High/Low Voltage Test
Generator

Parallel Testing Architecture
    Maury Microwave
Mixed Signal Active Load 
Pull System (1 - 40 GHz)
Accel-RF - Reliability
Accelerated Life/Burn-In Test
RF and DC Performance

DC Power Designs (60W to
400W)
Tresky - T-6000:
Automated Die / Flip Chip Bonder
Sonoscan - C-SAMŽ:
Acoustic Microscopy
Johnstech - ROLTM 200:
Test Contactors (QFN, DFN...)
Tempronic - ThermoStreamŽ:
Thermal Inducing Vacuum Platform
inTest Sigma Systems:
Thermal Platforms (Hot/Cold Plates)
Related Products
       
CWI Technical Sales  ˇ  Phone: 732-536-3964  ˇ  Fax: 732-536-0495  ˇ