Feature: · Optimized for DC Parametric Test and Single Site WLR · Compatible with Standard 4.5” Rectangular Edge Card Holders · Compatible with Quick Disconnect Triaxial Cable Harnesses · Temperature Compensated for Use from -65°C to 300°C · Extended Temperature Option to 600°C · 40 Millimeter Ceramic Probe Card · fA Level Leakage Measurements · Quasi-Kelvin Connections Available · Several Connector Options Available
Celadon Systems, Inc. was founded to satisfy the semiconductor industry’s need for ultra high accuracy device characterization and for monitoring wafer level reliability tests over many sites over a long period of time. The semiconductor industry is an industry of extremes, and our ultra high performance probe cards and probing solutions are built to thrive in those extremes. Our patented crash-resistant ceramic designs ensure unparalleled precision, low leakage, and sustained reliability for a wide range of testing applications, from modeling & characterization, to wafer level reliability, to parametric test. · Extreme Reliability: Medical, Automotive, Aviation, Business Systems · Extreme Operating Voltages & Currents: microVolt to KiloVolt, attoAmps to kiloAmps · Extreme Operating Temperatures: Cryo to 600°C
T40 Series Probe Card: Ultra Low Noise. Ultra Fast Settling.
Feature: · Rigid Ceramic and Metal Chassis · Integrated Cable Strain Reliefs · 1 to 25 Pins Per Site · High Accuracy Capacitance Measurements · -65°C to 300°C Operating Temperature Ranges · Available in Regular Low Leakage (5 Femto Amps per Volt) · AttoFast™ with Guarded Tips for 2 Femto Amp/Volt Settling Time · Low Probe to Probe Capacitance for High Accuracy CV Measurements
Feature: · Elegant Twist & Lock Mechanism · Two Available Core Types: · Low Leakage of < 5 fA/V · AttoFast™ of sub-1 fA/V · Delivers Long Lifetime & Infinite Rebuilds · Operating Temperature Ranges -65°C to 200°C · Standard X/Y accuracy 10% Pad Size · Compatible with Keithley S600 & Agilent 407x/408x series
Feature: · 20 Millimeter Ceramic Probe Card · Leakage as Low as 5 fA/V · Minimum Pitch 50µm · Can be Configured with up to 48 Probes · As either Single or Dual Layer · Operating Temperature Range -65°C to 200°C · Standard X/Y Accuracy 10% Pad Size · Standard Z Accuracy +/- 5 microns · Combine with 45E - 4.5” Industry-Standard · Combine with 4080E - Parametric Test · Compatible with Agilent 407x/408x Series Testers
Wafer Level Reliability
TV19 VersaTileTM & VersAdjustTM Plates: Single Site or Multi-Site Reliability Testing
Feature: · Compatible with Quick Disconnect Triaxial Cable Harnesses · Temperature Compensated for Use from -65°C to 300°C · Compatible with Standard 4.5” Probe Card Holders · Fits Conventional 3-Hole Mount Probe Positioner · Optimized for DC Parametric Test and WLR · fA/V Level Leakage Measurements · Quasi-Kelvin Connections Available · Several Connector Options Available
Feature: · Optimized for Muti-Site DC Parametric Test and Multi-Site WLR · Compatible with Standard 4.5” Rectangular Edge Card Holders · Compatible with Quick Disconnect Triaxial Cable Harnesses · Temperature Compensated for Use from -65°C to 300°C · Extended Temperature Option to 400°C · 90 Millimeter Ceramic Probe Card · fA Level Leakage Measurements · Quasi-Kelvin Connections Available · Several Connector Options Available
T90 Series Probe Card: Low Leakage or High Temperature Models
Feature: · Compatible with Quick Disconnect Triaxial Cable Harnesses · Temperature Compensated for Use from -65°C to 300°C · 200 & 300 Millimeter Ceramic Button Probe Card · For use with the Celadon Modular Adapter™ · Extended Temperature Option to 400°C · Optimized for Multi-Site WLR · fA Level Leakage Measurements · Quasi-Kelvin Connections Available · Several Connector Options Available
The Element Series Optimized for DC Parametric Test, Modeling and Characterization, & Single Site WLR
The Element Series Indexer:
Feature: · Designed to hold Five Separate VC20 Probe Cards · Automatically Change Cards in Seconds · System can Perform Diagnostics with ‘Golden Probe Card’ · No Electrical Components · Performs all Functions with Self-Contained Air Compression
Feature: · Converts the VC20 Probe Card into an Industry-Standard 4.5? Probe Card · Leave the 45E in the Tester During Card Changes · Minimize the Risk of Cable Connect Issues and Save Time
Feature: · Converts the VC20 Probe Card into a Production Parametric Test Probe Card · For Agilent 407x/408x Series Testers · Leave the 4080E in the Tester During Card Changes
Celadon develops and manufactures highly reliable, customized solutions for micro-chip testing, to the highest quality standards, in the shortest time. Our Focus: · Customized R&D Concepts for Microchip Testing · Probe Card and Test Interfacing for Power and Automotive IC's · One-Stop-Shop: Engineering -Design - Manufacturing - Assembly · Total Ownership for Test Hardware
Automotive & Mixed Singal IC Probe Cards:
Applications characterized by a combination of logic circuitry and power outputs sharing the same die give special challenges for probe cards design and manufacturing - high density, fine pitch bond pads for the logic part in combination with hefty currents to be tested going up to several Amps.
150°C High Temp Probe Card with Heat Shield and Air Cooling Device
"SmartClamp" Protected Power Outputs, Dual Die Configuration
Vertical Probe Cards:
Vertical Probe Card with "SmartClamp"
Quad-Die Vertical Probe Head and Interposer
T.I.P.S.' Vertical Probe Cards specifically developed to address: · Low Resistance and High Current Carrying Capability Probes · "SmartClamp" Probe Card Protection · Protects probes and D.U.T. from overcurrent spikes · Special interposer technology allows for high currents and good signal integrity. · Numerical simulation of probe and wafer contact heating enables to define S.O.A.R. (safe operating area) in pulsed and DC high current application.
Feature: · -40°C to 150°C Operating Temperature Ranges · “SmartClamp” probe protection technology allows safe testing of highest currents up to 100 Amps.