Wafer Level Reliability
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High density, multisite, high temperature wafer level reliability testing is possible in a variety of formats with probe cards and probing solutions from Celadon.
Celadon - T-90:
90 Millimeter Ceramic Probe Card
Feature Highlights:

     Optimized for Multi-Site DC Parametric Test and Multi-Site WLR
     Compatible with Standard 4.5 Rectangular Edge Card Holders
     Temperature Compensated for Use from -65C to 300C
     Femto-Amp Level Leakage Measurements
     Compatible with Quick Disconnect Celadon Triaxial Cable Harnesses
     Quasi-Kelvin Connections Available
     Several Connector Options Available
Front End Metrology/Inspection Back End Test & Measurement
CWI Technical Sales    Phone: 732-536-3964    Fax: 732-536-0495