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METROLOGY & INSPECTION

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Automated Optical Inspection

  • 2D or 3D

  • Wafer, Diced on Frame, Substrates, Modules, Wire Bonds, PCB

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MultiSensor Metrology

  • Bow, Warp and TTV

  • Trench Depth, Thickness

  • Overlay

  • Topography (Shape, Structure)

  • Roughness

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Film Thickness/Trench Depth

  • Ultra Thin & Thick Films

  • Multi-Layer Films Stacks

  • Depth, CDs, Profiles

OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

© 2023 by Dr. Repair. Proudly created with Wix.com

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