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TEST & MEASUREMENT

RF Probes
Micropositioners
Die Level Test Systems
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Probe Stations

  • Manual, Semi-Auto, Fully-Auto

  • DC, RF, High Power and Photonics

  • RF Probes and Probe Cards

  • Micropositioners

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Thermal Forcing Systems

  • -100° to +300°C

  • Tabletop to Production

  • Quiet & Eco-Friendly

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Tuners

  • Load Pull

  • Noise Figure

  • Pulsed IV

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Power Device Testers

  • Die, Wafer or Package Level

  • High Speed

  • Expandable

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Thermal Platforms

  • -100°C to +200°C

  • Benchtop or Rackmounted

  • Various Sizes

  • Customizable

  • LN2, LCO2 or Mechanical Cooling

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Amplifiers

  • Based upon state-of-the-art GaN PA modules

  • High continuous power across the band

  • High linearity for Wideband communications testing

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Semiconductor Test Handlers

  • Leaded & QFN Packages

  • Variety of Inputs & Outputs

  • Inspection

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Direct Contact Thermal Solution

  • -65 to +175C

  • Up to 55W at -55C

  • No thermoelectric components

  • Up to <35 secs over 25 to -40C

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Probe Cards

  • Reliability

  • High Voltage

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Thermal Chambers

  • -185C to +500C

  • Benchtop or Rack Mounted

  • Transition Rates up to 100°C/minute

  • LN2, LCO2 or Mechanical Cooling

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Power Module

Test Handlers

  • Power Device & Modules

  • Variety of Package Types

  • Over temperature Test

OVER 40 YEARS EXPERIENCE

Located in Central New Jersey, CWI has been representing tier-one equipment suppliers for over 40 years.

PRODUCTS

- Test & Measurement

- Wafer Processing

- Metrology/Inspection

- Backend Operations

- Failure Analysis

VISIT US

704 Ginesi Drive, Suite 11A
Morganville, NJ, 07751

© 2023 by Dr. Repair. Proudly created with Wix.com

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